Solar Metrology, a global provider of x-ray fluorescence (XRF) analysis tools, introduces the SMX Tool Suite for XRF film thickness and composition measurement of CIGS and CdTe photovoltaic depositions.

The SMX measurement system is a production-ready suite of XRF film thickness and composition measurement tools designed for research and process development, in-process monitoring and post-process quality control. The SMX product line features four tool configurations: a bench-top system, a full-panel analysis system, an in-line system and an in-situ system. Utilizing a common XRF platform, adapted to optimal insertion points in the factory, allows for a consistent operator interface and insures reproducibility between SMX tools across the process. Solar Metrology is the global leader in the development and manufacture of high-performance X-Ray Fluorescence (XRF) analysis tools, specifically engineered to meet the demanding thin film measurement requirements of the solar electric and renewable power industries. www.solarmetrology.com
 

Last update: 14 November 2008 at 08:04

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